Replica Tape: Unlocking Hidden Information

From JPCL, July 2015

By David Beamish, DeFelsko Corporation


by David Beamish, DeFelsko Corporation

A surface profile is composed of a complex pattern of peaks and valleys. This article explains a developing technology that allows for extraction of useful information from replica tape, beyond just peak height....
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Tagged categories: Quality control; Replica tape; Surface preparation; Surface Preparation; Surface preparation equipment; Surface profile

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