Statistical and Technical Evaluation of Rapid DFT Measurement Technologies

From JPCL, November 2018

By Jeff O’Dell, Wayne McGaulley and Evan Parson, Vision Point Systems, Inc.; and John Wegand, Paul Slebodnick and Jimmy Tagert, U.S. Naval Research Laboratory

This article reports on a study conducted to investigate a proposed alternative to the SSPC-PA 2 method, that of rapid scanning procedures to measure DFT using handheld electronic devices, and to verify whether any losses in precision, and thus fidelity, of the data resulted from the use of the new scanning method. Findings from the Naval Research Laboratory were used to develop recommendations for the use of DFT scanning probe technology in the field....


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