Statistical and Technical Evaluation of Rapid DFT Measurement Technologies

From JPCL, November 2018

By Jeff O’Dell, Wayne McGaulley and Evan Parson, Vision Point Systems, Inc.; and John Wegand, Paul Slebodnick and Jimmy Tagert, U.S. Naval Research Laboratory

This article reports on a study conducted to investigate a proposed alternative to the SSPC-PA 2 method, that of rapid scanning procedures to measure DFT using handheld electronic devices, and to verify whether any losses in precision, and thus fidelity, of the data resulted from the use of the new scanning method. Findings from the Naval Research Laboratory were used to develop recommendations for the use of DFT scanning probe technology in the field....


(Login to read the full article)
   

Comment Join the Conversation:

Sign in to our community to add your comments.

Advertisements
 
SAFE Systems, Inc.

 
SABRE Autonomous Solutions

 
RCG America

 
Mitsubishi Gas Chemical America

 
HoldTight Solutions Inc.

 
Fischer Technology Inc.

 
 
 
 

Technology Publishing Co., 1501 Reedsdale Street, Suite 2008, Pittsburgh, PA 15233

TEL 1-412-431-8300  • FAX  1-412-431-5428  •  EMAIL webmaster@paintsquare.com


The Technology Publishing Network

PaintSquare the Journal of Protective Coatings & Linings Paint BidTracker

 
EXPLORE:      JPCL   |   PaintSquare News   |   Interact   |   Buying Guides   |   Webinars   |   Resources   |   Classifieds
REGISTER AND SUBSCRIBE:      Free PaintSquare Registration   |   Subscribe to JPCL   |   Subscribe to PaintSquare News
MORE:      About PaintSquare.com   |   Privacy Policy   |   Terms & Conditions   |   Support   |   Site Map   |   Search   |   Contact Us