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Analyzer Measures Thickness and More

Thursday, July 12, 2012

More items for Quality Control

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Eastern Applied Research, a longtime maker of x-ray fluorescence instruments, has unveiled the newest addition to its year-old Element Xr line of x-ray fluorescence (XRF) analyzers.

 Element Xr
The Element Xr line was introduced in April 2011. This is the M5. The newest model is the M6.

The Element Xr M6 is designed to not only accurately measure a range of coating thicknesses but also obtain qualitative and quantitative analysis of materials, the company reports.

Available with three options for detector systems, the EXr M6 can be customized to provide the best price-to-performance ratio for a specific testing need, the manufacturer says.

The traditional version features a proportional counter detection system and is optimum for standard coating thickness measurements. This configuration is the most economical.

Other optional detector technologies provide increased sensitivity, greater resolution and faster measurement times.

Design and Features

The chamber design was developed with versatility of application in mind and includes a new software package that provides streamlined navigation and report functionality through its Windows7 OS operation.

Based in Rockport, NY, Eastern Applied Research has provided x-ray fluorescence solutions for coating thickness measurement and material analysis needs for more than 20 years.

More information: www.EasternApplied.com.

   

Tagged categories: Coating / Film thickness; Performance testing; Quality control; Thickness gauge

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